Povratak
Scanning probe microscopy - physical property characterization at nanoscale / edited by Vijay Nalladega
Scanning probe microscopy - physical property characterization at nanoscale / edited by Vijay Nalladega
Impresum
Rijeka : InTech, 2012.
Mjesto izdavanja
Materijalni opis
256 str.
Izdanje
1st ed
Jezik
Nakladnik
Način izrade datoteke
Format
Vrsta
•
Zbirka
Prava
Pristup
https://www.intechopen.com/books/scanning-probe-microscopy-physical-property-characterization-at-nanoscale
NBN.HR
NBN: urn:nbn:hr:238:560665
DOI
10.5772/2653
ISBN
978-953-51-4998-9 (PDF) ; 978-953-51-0576-3